Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results