Intended for all types of field network architectures, the FIP-400 fiber inspection probe from EXFO Electro-Optical Engineering delivers one of the best resolutions on the market for a handheld field ...

In the last episode, we put our circuit boards through the reflow process. Unfortunately, it’s not 100% accurate, and there are often problems that can occur that need to be detected and fixed. That’s ...

Beaverton, OR. Tektronix today introduced two new optical modules for its DSA8300 sampling oscilloscope that offer high sensitivity and low noise, giving manufacturers the confidence they need to ...

This scanning electron microscope image of cardiomyocyte cells cultured on an array of electro-plasmonic nanoantennae shows the considerable size difference between the nanoantennae and electrogenic ...

Wafers produced for products as diverse as LEDs and MP3 players vary greatly in function, but they have one thing in common: They often undergo optical inspection after they pass an electrical test.

(Nanowerk Spotlight) Back in the 1970s, Arthur Ashkin of Bell Laboratories found that radiation pressure – the ability of light to exert pressure to move small objects – could be harnessed to ...

Microscopes are of three basic types: optical, electron (or ion), and scanning probe. The modern optical or light microscope was developed in the mid-19th century. Optical microscopes use transparent ...