Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...

TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...